David J. Rowenhorst and Alexis C. Lewis

For the paper, “Image Processing and Analysis of 3-D Microscopy Data”

AIME Rossiter W. Raymond Memorial Award in 2012

 

 

 

 

 

 

 


Alexis C. Lewis received her S.B. in 1997 from the Massachusetts Institute of Technology (MIT) and Ph.D. in 2003 from the Johns Hopkins University, both in Materials Science and Engineering. In 2003 she joined the Naval Research Laboratory as a National Research Council postdoctoral associate, and became a staff scientist in the Multifunctional Materials Branch in 2005. Her research interests center around advanced materials characterization, including 3D analysis of the crystallography and mechanical response of materials. Dr. Lewis is a member of the Materials Research Society, TMS, and ASM.